Three-Dimensional X-Ray Diffraction Microscopy
Poulsen, Henning Friis
Produktnummer:
18d1cb5132658749e9b41b8a6c55435517
| Autor: | Poulsen, Henning Friis |
|---|---|
| Themengebiete: | Grain dynamics Grain maps X-ray diffraction chemistry crystallography dynamics |
| Veröffentlichungsdatum: | 31.08.2004 |
| EAN: | 9783540223306 |
| Sprache: | Englisch |
| Seitenzahl: | 156 |
| Produktart: | Gebunden |
| Verlag: | Springer Berlin |
| Untertitel: | Mapping Polycrystals and their Dynamics |
Produktinformationen "Three-Dimensional X-Ray Diffraction Microscopy"
Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing. The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.
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