Surface Microscopy with Low Energy Electrons
Bauer, Ernst
| Autor: | Bauer, Ernst |
|---|---|
| Themengebiete: | Arbeitsstoff Festkörperphysik Material Mikroskopie Spektroskopie Werkstoff |
| Veröffentlichungsdatum: | 11.07.2014 |
| EAN: | 9781493909346 |
| Auflage: | 2014 |
| Sprache: | Englisch |
| Seitenzahl: | 516 |
| Produktart: | Gebunden |
| Verlag: | Springer New York Springer US, New York, N.Y. |
Produktinformationen "Surface Microscopy with Low Energy Electrons"
This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.
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