Strain Effect in Semiconductors
Sun, Yongke, Thompson, Scott E, Nishida, Toshikazu
| Autor: | Nishida, Toshikazu Sun, Yongke Thompson, Scott E |
|---|---|
| Themengebiete: | Technology & Industrial Arts |
| Veröffentlichungsdatum: | 04.12.2009 |
| EAN: | 9781441905512 |
| Auflage: | 2010 |
| Sprache: | Englisch |
| Seitenzahl: | 350 |
| Produktart: | Gebunden |
| Verlag: | Springer US, New York, N.Y. Springer Us |
| Untertitel: | Theory and Device Applications |
Produktinformationen "Strain Effect in Semiconductors"
Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. The book discusses relevant applications of strain while also focusing on the fundamental physics as they pertain to bulk, planar, and scaled nano-devices. Lead authors Yongke Sun, Scott Thompson and Toshikazu Nishida also: Treat strain physics at both the qualitative overview level as well as provide detailed fundamentals Explain strain physics relevant to logic devices as well as strain-based MEMS This book is relevant to current strained Si logic technology, as well as for understanding the physics and scaling of future strain nano-scale devices. It is perfect for practicing device engineers at semiconductor manufacturers, as well as graduate students studying device physics at universities.
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