Zu "Synchrotron Small and Wide-Angle X-ray Scattering & Diffraction" wurden 2 Produkte gefunden
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In-situ Structure Characterization of Elastomers during Deformation and Fracture
106,99 €*
Preise inkl. MwSt. zzgl. Versandkosten
In-situ Structure Characterization of Elastomers during Deformation and Fracture
106,99 €*
Preise inkl. MwSt. zzgl. Versandkosten