Radiation Hardened CMOS Integrated Circuits for Time-Based Signal Processing
Prinzie, Jeffrey, Steyaert, Michiel, Leroux, Paul
Produktnummer:
1816a90fe2c8ea471f90c2e1a51b95052d
| Autor: | Leroux, Paul Prinzie, Jeffrey Steyaert, Michiel |
|---|---|
| Themengebiete: | Fault-tolerant design Radiation-Tolerant Circuits Radiation-hardened circuits Radiation Effects in CMOS Soft errors |
| Veröffentlichungsdatum: | 05.01.2019 |
| EAN: | 9783030087456 |
| Sprache: | Englisch |
| Seitenzahl: | 183 |
| Produktart: | Kartoniert / Broschiert |
| Verlag: | Springer International Publishing |
Produktinformationen "Radiation Hardened CMOS Integrated Circuits for Time-Based Signal Processing"
This book presents state-of-the-art techniques for radiation hardened high-resolution Time-to-Digital converters and low noise frequency synthesizers. Throughout the book, advanced degradation mechanisms and error sources are discussed and several ways to prevent such errors are presented. An overview of the prerequisite physics of nuclear interactions is given that has been compiled in an easy to understand chapter. The book is structured in a way that different hardening techniques and solutions are supported by theory and experimental data with their various tradeoffs.Based on leading-edge research, conducted in collaboration between KU Leuven and CERN, the European Center for Nuclear ResearchDescribes in detail advanced techniques to harden circuits against ionizing radiationProvides a practical way to learn and understand radiation effects in time-based circuitsIncludes an introduction to the underlying physics, circuitdesign, and advanced techniques accompanied with experimental data
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