Physical Principles of Electron Microscopy
Egerton, R.F.
Produktnummer:
183e63632bde42478e92d627dc47c91f45
| Autor: | Egerton, R.F. |
|---|---|
| Themengebiete: | Microscopy Monochromator Transmission X-ray Emission Spectroscopy crystal diffraction electron microscope electron microscopy nanotechnology optical microscope |
| Veröffentlichungsdatum: | 03.08.2005 |
| EAN: | 9780387258003 |
| Sprache: | Englisch |
| Seitenzahl: | 202 |
| Produktart: | Gebunden |
| Verlag: | Springer US |
| Untertitel: | An Introduction to TEM, SEM, and AEM |
Produktinformationen "Physical Principles of Electron Microscopy"
Scanning and stationary-beam electron microscopes have become an indespensible tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book provides an introduction to the theory and current practice of electron microscopy, aimed primarily at undergraduates who need to learn how the basic principles of physics are applied in an important area of science and technology that has contributed greatly to our knowledge of life processes and "inner space." However, it will be equally valuable for technologists who make use of electron microscopes and for graduate students, university teachers and researchers who need a concise text that deals with the basic principles of microscopy. Less technical but broader in scope than other microscopy textbooks, Physical Principles of Electron Microscopy is appropriate for undergraduates and technologists with limited mathematical training.
Sie möchten lieber vor Ort einkaufen?
Sie haben Fragen zu diesem oder anderen Produkten oder möchten einfach gerne analog im Laden stöbern? Wir sind gerne für Sie da und beraten Sie auch telefonisch.
Juristische Fachbuchhandlung
Georg Blendl
Parcellistraße 5 (Maxburg)
8033 München
Montag - Freitag: 8:15 -18 Uhr
Samstags geschlossen