Functional Design Errors in Digital Circuits
Chang, Kai-hui, Markov, Igor L., Bertacco, Valeria
Produktnummer:
18d2182725f386494680c62a26253f52be
| Autor: | Bertacco, Valeria Chang, Kai-hui Markov, Igor L. |
|---|---|
| Themengebiete: | Automatic debugging Error diagnosis Error repair Post-silicon debugging algorithms circuit design formal verification integrated circuit layout simulation |
| Veröffentlichungsdatum: | 10.12.2008 |
| EAN: | 9781402093647 |
| Sprache: | Englisch |
| Seitenzahl: | 200 |
| Produktart: | Gebunden |
| Verlag: | Springer Netherland |
| Untertitel: | Diagnosis Correction and Repair |
Produktinformationen "Functional Design Errors in Digital Circuits"
Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
Sie möchten lieber vor Ort einkaufen?
Sie haben Fragen zu diesem oder anderen Produkten oder möchten einfach gerne analog im Laden stöbern? Wir sind gerne für Sie da und beraten Sie auch telefonisch.
Juristische Fachbuchhandlung
Georg Blendl
Parcellistraße 5 (Maxburg)
8033 München
Montag - Freitag: 8:15 -18 Uhr
Samstags geschlossen