Design for Testability, Debug and Reliability
Huhn, Sebastian, Drechsler, Rolf
Produktnummer:
188f6c3782770740a8b7b73934a7c916b1
| Autor: | Drechsler, Rolf Huhn, Sebastian |
|---|---|
| Themengebiete: | Circuit Design for Reliability Digital System Test SoC Testing Testability, debug, and reliability Testable Design |
| Veröffentlichungsdatum: | 20.04.2021 |
| EAN: | 9783030692087 |
| Sprache: | Englisch |
| Seitenzahl: | 164 |
| Produktart: | Gebunden |
| Verlag: | Springer International Publishing |
| Untertitel: | Next Generation Measures Using Formal Techniques |
Produktinformationen "Design for Testability, Debug and Reliability"
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.
Sie möchten lieber vor Ort einkaufen?
Sie haben Fragen zu diesem oder anderen Produkten oder möchten einfach gerne analog im Laden stöbern? Wir sind gerne für Sie da und beraten Sie auch telefonisch.
Juristische Fachbuchhandlung
Georg Blendl
Parcellistraße 5 (Maxburg)
8033 München
Montag - Freitag: 8:15 -18 Uhr
Samstags geschlossen