Design for Manufacturability and Yield for Nano-Scale CMOS
Chiang, Charles, Kawa, Jamil
| Autor: | Chiang, Charles Kawa, Jamil |
|---|---|
| Themengebiete: | Betriebssystem (EDV) CAD - Computer Aided Design CAM - Computer Aided Manufacturing CMOS Chip EDV / Theorie / Software-Entw. / Software Engineering Elektrotechnik Ingenieurwissenschaft - Ingenieurwissenschaftler Maschinenbau Nanotechnologie Operating System Technologie / Nanotechnologie |
| Veröffentlichungsdatum: | 26.07.2007 |
| EAN: | 9781402051876 |
| Sprache: | Englisch |
| Seitenzahl: | 288 |
| Produktart: | Gebunden |
| Verlag: | Springer Springer Netherland |
Produktinformationen "Design for Manufacturability and Yield for Nano-Scale CMOS"
Manufacturability and yield are no longer a fabrication, packaging, and test concerns. They are aspects that have to be designed in, and they are everybody's responsibility. Design for Manufacturability and Yield for Nano-Scale CMOS walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process and how to address each aspect at the proper design step starting with the layout of standard cells and how to yield-grade libraries for critical area and lithography artifacts through place and route, CMP model based simulation and dummy-fill insertion, and through statistical timing closure of the design. It alerts the designer to the pitfalls to watch for and to the good practices that can enhance a design's manufacturability and yield. A must read book for the serious designer.
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