Design for AT-Speed Test, Diagnosis and Measurement
Produktnummer:
18e31011c7d7104825b79e5bb596dde5ba
| Themengebiete: | development diagnosis drift transistor logic system design |
|---|---|
| Veröffentlichungsdatum: | 26.04.2013 |
| EAN: | 9781475782912 |
| Sprache: | Englisch |
| Seitenzahl: | 239 |
| Produktart: | Kartoniert / Broschiert |
| Herausgeber: | Nadeau-Dostie, Benoit |
| Verlag: | Springer US |
Produktinformationen "Design for AT-Speed Test, Diagnosis and Measurement"
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
Sie möchten lieber vor Ort einkaufen?
Sie haben Fragen zu diesem oder anderen Produkten oder möchten einfach gerne analog im Laden stöbern? Wir sind gerne für Sie da und beraten Sie auch telefonisch.
Juristische Fachbuchhandlung
Georg Blendl
Parcellistraße 5 (Maxburg)
8033 München
Montag - Freitag: 8:15 -18 Uhr
Samstags geschlossen