Characterization of Solid Polymers
Produktnummer:
187ae2ee2df8de464c8a67e1e7c92b83dc
Themengebiete: | Polymer Siliconharzmasse crystal infrared spectroscopy microscopy nuclear magnetic resonance (NMR) spectroscopy |
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Veröffentlichungsdatum: | 31.05.1994 |
EAN: | 9780412584909 |
Sprache: | Englisch |
Seitenzahl: | 368 |
Produktart: | Gebunden |
Herausgeber: | Spells, S.J. |
Verlag: | Springer Netherland |
Untertitel: | New techniques and developments |
Produktinformationen "Characterization of Solid Polymers"
The last decade or so has seen a dramatic increase in the amount of detailed structural information available from a range of experimental techniques. Exciting new techniques such as atomic force microscopy have become widely available, while the potential of established methods like X-ray diffraction and electron microscopy has been greatly enhanced by powerful new sources and analytical methods. Progress in computing has also had a widespread impact: in areas such as neutron scattering, large data sets can now be manipulated more readily. The software supplied with commercial instruments generally provides more sophisti cated analytical facilities, while time-resolved X-ray studies rely on rapid data handling capabilities. The polymer scientist is faced with an expanding array of experimental tools for addressing both fundamental science and industrial problems. This work reviews some recent developments in structural techniques, with the aim of presenting the current 'state of the art' in a selection of areas.

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